Keithley High-Performance Source Measure Units for Precision Testing Applications

MP5000 Modular Precision Test Systems

  • 1U mainframe with 3 slots
  • Up to 6 channels per 1U mainframe
  • Mix & match PSU & SMU

Keithley 2400 Graphical Touchscreen Series SMU

  • Nanostructured Materials Research
  • Power Semiconductor GaN, SiC
  • Biosensor Development
  • Semiconductor Device Design
  • Automotive Sensor Design

SMU 2600B: Single or Dual Channel Systems

  • Semiconductor Production Test
  • Semiconductor Device Design
  • Transistor Characterization
  • IDDQ Testing and Standby Current Testing
  • Multi-Pin Device Test

2601B-PULSE System SourceMeter® 10 μs Pulser/SMU Instrument

  • VCSEL Test for LIDAR
  • High Brightness LED Test
  • Laser Diode Production Test
  • Semiconductor Device Design

Keithley 2400 Standard Series SMU

  • Resistor/Resistor Network Production Test
  • Connector, Relay, Switch Test
  • Accelerated Stress Testing
  • Circuit Protection Device Test
  • Materials Research

SMU 2650 Series for High Power

  • Power Semiconductor GaN, SiC
  • Solar Panel Test
  • Electromigration studies
  • Semiconductor junction temperature characterization

SMU 2606B: High Density SMU

  • VCSEL, Laser Diode Production Test
  • LED Production Test
  • Transistor Characterization

Optical SMU for Laser Diode

  • Optoelectronics Research
  • LIV VCSEL Test
  • Laser Diode Temperature Control

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